How to use it
- Enter nonnegative defects per cm².
- Enter die area and optional dies per wafer.
- Calculate the Poisson estimate.
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Explore a simplified Poisson yield estimate.
This educational model relates a uniform defect-density assumption to die area.
After converting area to cm², yield equals e raised to negative defect density times area.
A 1 cm² die at 0.5 defects/cm² gives about 60.65% Poisson yield.
Real yield depends on process, defect distribution, redundancy, testing, binning and maturity.